Sl.No Item Name Quantity
1 Secondary Ion Mass Spectroscopy (SIMS) Analysis/Measurement for Si/SiGe/Si Samples( NA )
Min Qty per order: 1 Each , Max Qty per order: 5 Each , Total Qty: 5 Each
1Each
2 Secondary Ion Mass Spectroscopy (SIMS) Analysis/Measurement for AlGaN/GaN/AlGaN samples( NA )
Min Qty per order: 1 Each , Max Qty per order: 10 Each , Total Qty: 10 Each
1Each
3 Secondary Ion Mass Spectroscopy (SIMS) Analysis/Measurement for Binary and Ternary III-V layers with Mixed Arsenide/Phosphide Structures( NA )
Min Qty per order: 1 Each , Max Qty per order: 10 Each , Total Qty: 10 Each
1Each